Akademik Veri Yönetim Sistemi
IEEE 31st VLSI Test Symposium (VTS), California, Amerika Birleşik Devletleri, 29 Nisan - 02 Mayıs 2013
The increasing multiplicity of defect types forces the inclusion of tests from a variety of fault models. The quest for test quality is checkmated though by the considerable and frequently unnecessary cost of the large number of tests, driven by the lack of a clear correspondence between defects and fault models. While the static derivation of the appropriate test mixes from a variety of fault models to deliver high test quality at low cost is a desirable goal, it is challenged by the frequent changes in defect characteristics. The consequent necessity for adaptivity is addressed in this paper through a test framework that utilizes the continuous stream of failing test data during production testing to track the varying test quality based on evolving defect characteristics and thus dynamically adjust the production test set to deliver a target defect escape level at minimal test cost.