B. Arslan And A. Orailoglu, "Tracing the Best Test Mix through Multi-Variate Quality Tracking," IEEE 31st VLSI Test Symposium (VTS) , California, United States Of America, 2013
Arslan, B. And Orailoglu, A. 2013. Tracing the Best Test Mix through Multi-Variate Quality Tracking. IEEE 31st VLSI Test Symposium (VTS) , (California, United States Of America).
Arslan, B., & Orailoglu, A., (2013). Tracing the Best Test Mix through Multi-Variate Quality Tracking . IEEE 31st VLSI Test Symposium (VTS), California, United States Of America
Arslan, BARIŞ, And Alex Orailoglu. "Tracing the Best Test Mix through Multi-Variate Quality Tracking," IEEE 31st VLSI Test Symposium (VTS), California, United States Of America, 2013
Arslan, BARIŞ And Orailoglu, Alex. "Tracing the Best Test Mix through Multi-Variate Quality Tracking." IEEE 31st VLSI Test Symposium (VTS) , California, United States Of America, 2013
Arslan, B. And Orailoglu, A. (2013) . "Tracing the Best Test Mix through Multi-Variate Quality Tracking." IEEE 31st VLSI Test Symposium (VTS) , California, United States Of America.
@conferencepaper{conferencepaper, author={BARIŞ ARSLAN And author={Alex Orailoglu}, title={Tracing the Best Test Mix through Multi-Variate Quality Tracking}, congress name={IEEE 31st VLSI Test Symposium (VTS)}, city={California}, country={United States Of America}, year={2013}}