CircularScan: A scan architecture for test cost reduction

Arslan B., Orailoglu A.

Design, Automation and Test in Europe Conference and Exhibition (DATE 04), Paris, Fransa, 16 - 20 Şubat 2004, ss.1290-1295, (Tam Metin Bildiri) identifier identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası:
  • Doi Numarası: 10.1109/date.2004.1269073
  • Basıldığı Şehir: Paris
  • Basıldığı Ülke: Fransa
  • Sayfa Sayıları: ss.1290-1295
  • Acıbadem Mehmet Ali Aydınlar Üniversitesi Adresli: Hayır

Özet

Scan-based designs are widely used to decrease the complexity of the test generation process; nonetheless, they increase test time and volume. A hew scan architecture is proposed to reduce test time and volume while retaining the original scan input count.. The proposed architecture allows the use of the captured response as a template for the next pattern with only the necessary bits of the captured response being updated while observing the full captured response. The theoretical and experimental analysis promises a substantial reduction in test cost for large circuits.