Arslan, B. And Orailoglu, A. 2004. CircularScan: A scan architecture for test cost reduction. Design, Automation and Test in Europe Conference and Exhibition (DATE 04) , (Paris, France), 1290-1295.

Arslan, B., & Orailoglu, A., (2004). CircularScan: A scan architecture for test cost reduction . Design, Automation and Test in Europe Conference and Exhibition (DATE 04) (pp.1290-1295). Paris, France

Arslan, BARIŞ, And A Orailoglu. "CircularScan: A scan architecture for test cost reduction," Design, Automation and Test in Europe Conference and Exhibition (DATE 04), Paris, France, 2004

Arslan, BARIŞ And Orailoglu, A. "CircularScan: A scan architecture for test cost reduction." Design, Automation and Test in Europe Conference and Exhibition (DATE 04) , Paris, France, pp.1290-1295, 2004

Arslan, B. And Orailoglu, A. (2004) . "CircularScan: A scan architecture for test cost reduction." Design, Automation and Test in Europe Conference and Exhibition (DATE 04) , Paris, France, pp.1290-1295.

@conferencepaper{conferencepaper, author={BARIŞ ARSLAN And author={A Orailoglu}, title={CircularScan: A scan architecture for test cost reduction}, congress name={Design, Automation and Test in Europe Conference and Exhibition (DATE 04)}, city={Paris}, country={France}, year={2004}, pages={1290-1295} }