Delay Test Resource Allocation and Scheduling for Multiple Frequency Domains


Arslan B. , Orailoglu A.

30th IEEE VLSI Test Symposium (VTS), Hawaii, United States Of America, 23 - 25 April 2012, pp.114-119 identifier identifier

  • Publication Type: Conference Paper / Full Text
  • Volume:
  • Doi Number: 10.1109/vts.2012.6231089
  • City: Hawaii
  • Country: United States Of America
  • Page Numbers: pp.114-119

Abstract

As the number of frequency domains aggressively grows in today's SOCs, the delivery of high delay test quality across numerous frequency domains while meeting test budgets is crucial. This goal necessitates not only the consideration of fault coverage but also the distinct characteristics of each domain such as frequency and the distribution of path lengths and, additionally, the delay test quality tradeoffs across these domains. This paper proposes a method to identify the optimal test time allocation per domain based on the distinct characteristics of each in order to minimize overall delay defect escape level. The proposed method not only considers test time allocation but also concurrent scheduling of domains to optimize the delay test quality for SOCs that support the testing of multiple frequency domains in parallel.