Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost


Arslan B. , Orailoglu A.

20th Asian Test Symposium (ATS), New Delhi, India, 20 - 23 November 2011, pp.323-328 identifier identifier

  • Publication Type: Conference Paper / Full Text
  • Volume:
  • Doi Number: 10.1109/ats.2011.91
  • City: New Delhi
  • Country: India
  • Page Numbers: pp.323-328

Abstract

Defect characteristics and consequently test quality vary throughout the production life cycle. An optimal test methodology needs to adjust the test set based on the ever changing defect characteristics to deliver consistent test quality levels. In this paper, we propose an adaptive test framework that alters the test set continuously by utilizing the history of recent failures to track the instantaneous defect escape level, thus reaching the target test quality level at minimal test cost.