Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost

Arslan B., Orailoglu A.

20th Asian Test Symposium (ATS), New Delhi, Hindistan, 20 - 23 Kasım 2011, ss.323-328, (Tam Metin Bildiri) identifier identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası:
  • Doi Numarası: 10.1109/ats.2011.91
  • Basıldığı Şehir: New Delhi
  • Basıldığı Ülke: Hindistan
  • Sayfa Sayıları: ss.323-328
  • Acıbadem Mehmet Ali Aydınlar Üniversitesi Adresli: Hayır

Özet

Defect characteristics and consequently test quality vary throughout the production life cycle. An optimal test methodology needs to adjust the test set based on the ever changing defect characteristics to deliver consistent test quality levels. In this paper, we propose an adaptive test framework that alters the test set continuously by utilizing the history of recent failures to track the instantaneous defect escape level, thus reaching the target test quality level at minimal test cost.