Characterization of two-layer diffuse media by reflection of gigahertz photon density waves

Sunar U., Ripoll J., Akin A., Pourrezaei K.

23rd Annual International Conference of the IEEE-Engineering-in-Medicine-and-Biology-Society, İstanbul, Türkiye, 25 - 28 Ekim 2001, cilt.23, ss.3064-3065, (Tam Metin Bildiri) identifier identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası: 23
  • Basıldığı Şehir: İstanbul
  • Basıldığı Ülke: Türkiye
  • Sayfa Sayıları: ss.3064-3065
  • Acıbadem Mehmet Ali Aydınlar Üniversitesi Adresli: Hayır

Özet

Diffuse reflected light is used to characterize optical properties of two-layer turbid media. The source is modulated in gigahertz frequencies. The phase and amplitude of analytical reflectance is fitted to the data generated by adding 2.5% noise in amplitude and 1degrees noise in phase to the solution of diffusion approximation in gigahertz frequency regime. The extracted optical properties are in good agreement with the real values.