B. Tanoren, "The effect of thickness on surface structure of rf sputtered TiO2 thin films by X-ray photoelectron spectroscopy, atomic force microscopy and scanning acoustic microscopy," VACUUM , vol.182, pp.109766, 2020
Tanoren, B. 2020. The effect of thickness on surface structure of rf sputtered TiO2 thin films by X-ray photoelectron spectroscopy, atomic force microscopy and scanning acoustic microscopy. VACUUM , vol.182 , 109766.
Tanoren, B., (2020). The effect of thickness on surface structure of rf sputtered TiO2 thin films by X-ray photoelectron spectroscopy, atomic force microscopy and scanning acoustic microscopy. VACUUM , vol.182, 109766.
Tanoren, BUKEM. "The effect of thickness on surface structure of rf sputtered TiO2 thin films by X-ray photoelectron spectroscopy, atomic force microscopy and scanning acoustic microscopy," VACUUM , vol.182, 109766, 2020
Tanoren, BUKEM. "The effect of thickness on surface structure of rf sputtered TiO2 thin films by X-ray photoelectron spectroscopy, atomic force microscopy and scanning acoustic microscopy." VACUUM , vol.182, pp.109766, 2020
Tanoren, B. (2020) . "The effect of thickness on surface structure of rf sputtered TiO2 thin films by X-ray photoelectron spectroscopy, atomic force microscopy and scanning acoustic microscopy." VACUUM , vol.182, p.109766.
@article{article, author={BUKEM TANOREN}, title={The effect of thickness on surface structure of rf sputtered TiO2 thin films by X-ray photoelectron spectroscopy, atomic force microscopy and scanning acoustic microscopy}, journal={VACUUM}, year=2020, pages={109766} }