Arslan, B. And Orailoglu, A. 2010. Delay Test Quality Maximization through Process-aware Selection of Test Set Size. IEEE International Conference on Computer Design , (Amsterdam, Netherlands), 390-395.

Arslan, B., & Orailoglu, A., (2010). Delay Test Quality Maximization through Process-aware Selection of Test Set Size . IEEE International Conference on Computer Design (pp.390-395). Amsterdam, Netherlands

Arslan, BARIŞ, And Alex Orailoglu. "Delay Test Quality Maximization through Process-aware Selection of Test Set Size," IEEE International Conference on Computer Design, Amsterdam, Netherlands, 2010

Arslan, BARIŞ And Orailoglu, Alex. "Delay Test Quality Maximization through Process-aware Selection of Test Set Size." IEEE International Conference on Computer Design , Amsterdam, Netherlands, pp.390-395, 2010

Arslan, B. And Orailoglu, A. (2010) . "Delay Test Quality Maximization through Process-aware Selection of Test Set Size." IEEE International Conference on Computer Design , Amsterdam, Netherlands, pp.390-395.

@conferencepaper{conferencepaper, author={BARIŞ ARSLAN And author={Alex Orailoglu}, title={Delay Test Quality Maximization through Process-aware Selection of Test Set Size}, congress name={IEEE International Conference on Computer Design}, city={Amsterdam}, country={Netherlands}, year={2010}, pages={390-395} }