Arslan, B. And Orailoglu, A. 2016. Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS , vol.35, no.12 , 2093-2103.

Arslan, B., & Orailoglu, A., (2016). Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS , vol.35, no.12, 2093-2103.

Arslan, BARIŞ, And Alex Orailoglu. "Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment," IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS , vol.35, no.12, 2093-2103, 2016

Arslan, BARIŞ And Orailoglu, Alex. "Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment." IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS , vol.35, no.12, pp.2093-2103, 2016

Arslan, B. And Orailoglu, A. (2016) . "Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment." IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS , vol.35, no.12, pp.2093-2103.

@article{article, author={BARIŞ ARSLAN And author={Alex Orailoglu}, title={Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment}, journal={IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS}, year=2016, pages={2093-2103} }