Arslan, B. And Orailoglu, A. 2004. Test cost reduction through a reconfigurable scan architecture. 35th International Test Conference , (Charlottetown, Canada), 945-952.

Arslan, B., & Orailoglu, A., (2004). Test cost reduction through a reconfigurable scan architecture . 35th International Test Conference (pp.945-952). Charlottetown, Canada

Arslan, BARIŞ, And A Orailoglu. "Test cost reduction through a reconfigurable scan architecture," 35th International Test Conference, Charlottetown, Canada, 2004

Arslan, BARIŞ And Orailoglu, A. "Test cost reduction through a reconfigurable scan architecture." 35th International Test Conference , Charlottetown, Canada, pp.945-952, 2004

Arslan, B. And Orailoglu, A. (2004) . "Test cost reduction through a reconfigurable scan architecture." 35th International Test Conference , Charlottetown, Canada, pp.945-952.

@conferencepaper{conferencepaper, author={BARIŞ ARSLAN And author={A Orailoglu}, title={Test cost reduction through a reconfigurable scan architecture}, congress name={35th International Test Conference}, city={Charlottetown}, country={Canada}, year={2004}, pages={945-952} }